The ROG Phone 5 might have failed its bend test due to its unique segmented board and dual battery design

Asus’ new mobile-gaming flagship device, the ROG Phone 5, recently earned a shelving of shame following a catastrophic end to its round of JerryRigEverything’s popular durability tests. This failure was thought to be due to a weak point caused by a secondary USB type C port found on one side; however, the ROG Phone 3 also had one, and proved much more robust. A teardown may reveal what else is going on with this new phone.

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